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Aehr Test Systems lands key automotive semiconductor order for its GaN device testing system.
Aehr Test Systems received an initial production order for its FOX-XP wafer-level test and burn-in system from a leading automotive semiconductor supplier.
The system, designed for gallium nitride (GaN) devices used in automotive, solar, and data center applications, will begin shipping soon.
GaN devices are expected to grow significantly, with the market projected to reach $2.5 billion by 2029.
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Aehr Test Systems obtiene un pedido clave de semiconductores para su sistema de pruebas de dispositivos GaN.