Nearfield Instruments launches 'Lightning Mode' for QUADRA, a faster AFM metrology system for advanced semiconductor devices.

Nearfield Instruments launches 'Lightning Mode' for QUADRA®, the highest-throughput AFM metrology system for advanced semiconductor devices. QUADRA is now fully qualified and deployed for high-volume manufacturing, offering 3D non-destructive metrology for memory, logic processes, and high-aspect-ratio structures. This innovation accelerates time-to-yield and HVM yield optimization and control.

July 09, 2024
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